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为了解决传统方法制备Mg2Si1-xSnx(0≤x≤1.0)固溶体过程中带来Mg的氧化、挥发等问题,引进微波低温合成法,成功合成了Mg2Si1-xSnx热电固溶体,用XRD及SEM分析手段对合成的块体物相和形貌进行了表征,并系统研究了合成工艺对Mg2Si1-xSnx压坯制备的影响及Mg2Si1-xSnx压坯在微波场中的加热特性。结果表明:Mg2Si1-xSnx压坯在微波场中的加热升温曲线与Mg2Si1-xSnx压坯密度有关,随密度越大,升温速率降低;XRD分析表明在微波辐射下Mg2Si1-xSnx形成了良好的固溶体。
In order to solve the problems of oxidation and volatilization of Mg during the preparation of Mg2Si1-xSnx (0≤x≤1.0) solid solution by the traditional method, Mg2Si1-xSnx thermoelectric solid solution was successfully synthesized by microwave low temperature synthesis method. XRD and SEM analysis The phase and morphology of the synthesized block were characterized. The effects of the synthesis process on the preparation of Mg2Si1-xSnx compacts and the heating characteristics of Mg2Si1-xSnx compacts in the microwave field were systematically studied. The results show that the heating temperature curve of Mg2Si1-xSnx compact is related to the density of Mg2Si1-xSnx green compact, and the heating rate decreases with the increase of density. XRD analysis shows that Mg2Si1-xSnx forms a good solid solution under microwave irradiation.