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本文从长期工作实践中摸索总结出晶体管电路中带有一定普遍现象的两类软故障:即接触 不良和元器件(晶体等、电阻、电容)造成软故障的判断、检查与处理方法。
This paper explores and concludes two types of soft faults with some common phenomena in transistor circuits from long-term working practices: the bad touch and the judgments, inspection and processing methods of soft faults caused by components (such as crystals, resistors and capacitors).