Leaf area index (LAI) is an important parameter in a number of models related to ecosystem functioning, carbon budgets, climate, hydrology, and crop growth simulation. Mapping and monitoring the spatial and temporal variations of LAI are necessary for understanding crop growth and development at regional level. In this study, the relationships between LAI of winter wheat and Landsat TM spectral vegetation indices (SVIs) were analyzed by using the curve estimation procedure in North China Plain. The series of LAI maps retrieved by the best regression model were used to assess the spatial and temporal variations of winter wheat LAI. The results indicated that the general relationships between LAI and SVIs were curvilinear, and that the exponential model gave a better fit than the linear model or other nonlinear models for most SVIs. The best regression model was constructed using an exponential model between surface-reflectance-derived difference vegetation index (DVI) and LAI, with the adjusted R2 (0.82) and the RMSE (0.77). The TM LAI maps retrieved from DVI- LAI model showed the significant spatial and temporal variations. The mean TM LAI value (30 m) for winter wheat of the study area increased from 1.29 (March 7, 2004) to 3.43 (April 8, 2004), with standard deviations of 0.22 and 1.17, respectively. In conclusion, spectral vegetation indices from multi-temporal Landsat TM images can be used to produce fine-resolution LAI maps for winter wheat in North China Plain. Mapping and monitoring the spatial and temporal variations of LAI are necessary for understanding crop growth and development at regional level. In this study, the relationships between LAI of winter wheat and Landsat ™ spectral vegetation indices (SVIs) were analyzed by using the curve estimation procedure in North China Plain. The series of LAI maps retrieved by the best regression model were used to assess the spatial and temporal variations of winter wheat LAI. The results indicated that the general relationships between LAI and SVIs were curvilinear, and that the exponential model gave a better fit than the linear model or other nonlinear models for most SVIs. The best regression model was constructed using an exponential model between surface-reflectance-derived difference vegetation index (DVI) and LAI, with the The mean LAI value (30 m) for winter wheat of the study area increased from 1.29 (0.82) and the RMSE (0.77). The TM LAI maps retrieved from the DVI- LAI model showed the significant spatial and temporal variations. March, 2004) to 3.43 (April 8, 2004) with standard deviations of 0.22 and 1.17, respectively. In conclusion, spectral vegetation indices from multi-temporal Landsat ™ images can be used to produce fine-resolution LAI maps for winter wheat in North China Plain.