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利用Rene95合金在DD3单晶基材的 (0 0 1)面、(10 0 )面和与 (0 0 1)面夹角分别为 4 5°和 2 2 .5°的晶面上进行激光多层涂覆 ,研究了基材晶体取向对单晶显微组织的影响规律。研究表明 ,当实验在基材的择优晶面 { 0 0 1}上进行 ,涂层的组织为定向凝固柱状晶 ,晶体取向与基材的晶体取向相一致 ,一次间距约为 10 μm ,二次臂退化。当实验在基材的非择优晶面 (与(0 0 1)面的夹角θ分别为 4 5°和 2 2 .5°的晶面 )上进行 ,涂层的晶体取向仍然与基材的晶体取向一致 ,但枝晶二次臂出现 ,θ为4 5°角的晶面与 2 2 .5°角的晶面相比 ,枝晶二次臂的发展不平衡性加大。
Reynolds (R) alloy was used to fabricate the crystal plane of (0 0 1), (10 0) and the (0 0 1) planes with angles of 45 ° and 22.5 °, respectively, Layer coating, the effect of substrate crystal orientation on single crystal microstructure was studied. The results show that when the experiment is performed on the preferred crystal plane {0 0 1} of the substrate, the microstructure of the coating is oriented solidified columnar crystal. The crystal orientation is consistent with the crystal orientation of the substrate. The first pitch is about 10 μm, Degraded arm. When the experiments were performed on the non-preferential crystal plane of the substrate (crystal planes of 45 ° and 22.5 ° respectively to the (0 0 1) plane), the crystal orientation of the coating was still the same as that of the substrate However, the dendritic secondary arm appears, and the angle of 45 ° is larger than the angle of 22.5 °.