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用布里奇曼法慢速生长Cd_xHg_(1-x)Tg(CMT)晶体时,快速淬火可以揭示出淬火时的固/液界面。通过腐蚀纵向剖面而显示出来的界面的形状和厚度,正如利用红外透射测量所确定的那样,与最终径向组分变化有关。在一次淬火的晶体界面上,看到了界面的特征可认为是扩散界层。用光学显微镜和电子微探针分析,确定了界面的厚度。实验结果表明,正如所料,熔体搅拌减小扩散界层厚度。
Rapid growth of Cd_xHg_ (1-x) Tg (CMT) crystals by the Bridgman method can reveal the solid / liquid interface during quenching. The shape and thickness of the interface revealed by etching the longitudinal profile, as determined by infrared transmission measurements, is related to the change in the final radial composition. On a quenched crystal interface, it is seen that the characteristics of the interface can be considered as a diffusion boundary layer. Using optical microscopy and electron microprobe analysis, the thickness of the interface was determined. Experimental results show that, as expected, melt agitation decreases the thickness of the diffusion boundary layer.