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Highly charged 129 Xeq+(q =10-30) and 40Neq+(q =4-8) ion-induced secondary electron emissions on the surface of highly oriented pyrolytic graphite(HOPG) are reported.The total secondary electron yield is measured as a function of the potential energy of incident ions.The experimental data are used to separate contributions of kinetic and potential electron yields.Our results show that about 4.5% and 13.2% of ions potential energies are consumed in potential electron emission due to different Xeq+-HOPG and Neq+-HOPG combinations.A simple formula is introduced to estimate the fraction of ions potential energy for potential electron emission.