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提出一种精确测量波片相位延迟的方法。将待测波片置于起偏器和检偏器之间,转动待测波片和检偏器至不同的位置并探测输出的光强,得到波片的相位延迟。采用光源调制技术和解调技术,抑制了连续光所无法克服的背景光干扰和电子噪声的干扰;将光路分为测量光路和参考光路,采用软件除法技术,消除了光源波动的影响,从而实现波片相位延迟的精确测量。详细分析了影响测量精度的误差因素,主要有光源波长变化、温度变化、入射角倾斜、转台转角误差和光源波动,计算了1064 nm波长时厚度为0.52 mm的λ/4多级结晶石英波片产生的相位延迟误差,其中光源波动的影响在作除法后有显著的改善,各误差因素的总测量误差为±1.58°。实际测量了该λ/4结晶石英波片的相位延迟为91.06°±1.78°,与理论分析相符。该测量和误差分析方法同样适合其他的波片。
A method of accurately measuring the phase delay of wave plate is proposed. Place the wave plate to be measured between the polarizer and the analyzer. Turn the wave plate and the analyzer to different positions and detect the output light intensity to obtain the phase delay of the wave plate. Using light source modulation technology and demodulation technology, it can restrain the interference of background light and electronic noise which can not be overcome by the continuous light. The optical path is divided into the measuring light path and the reference light path, and the software division method is adopted to eliminate the influence of the light source fluctuation so as to realize Accurate measurement of wave plate phase delay. The error factors influencing the measurement accuracy are analyzed in detail. The main factors include wavelength change of light source, temperature change, incidence angle tilt, turntable rotation angle error and light source fluctuation. The λ / 4 multi-crystal quartz wave plate with thickness of 0.52 mm The resulting phase delay error, in which the impact of light source fluctuations after the division has significantly improved the total error of the measurement error of ± 1.58 °. The phase retardation of the λ / 4 crystal quartz wave plate was actually measured to be 91.06 ° ± 1.78 °, which is consistent with the theoretical analysis. This measurement and error analysis method is also suitable for other wave plates.