Vacuum brazing of SiO_2 glass ceramic and TC4 alloy using a commercially available TiZrNiCu foil was investigated. The interfaciai microstructure and the fractures were examined with an optical microscope (OM) and an S-4700 scanning electron microscope (SEM) equipped with an energy dispersive spectrometer (EDS) and an electron probe X-ray microanalyzer (EPMA). The structure of joint interface was identified by XRD (JDX-3530M). Meanwhile, the fracture paths of the joints were comprehensively studied. The results show that processing parameters, especially the brazing temperature, have a significant effect on the microstructurc and mechanical properties of joints. The typical interface structure is SiO_2/Ti_2O+Zr_3Si_2+Ti_5Si_3/(Ti,Zr)+Ti_2O+ TiZrNiCu/Ti(s.s)/TiZrNiCu+Ti(s.s)+Ti_2(Cu,Ni)/TC4 from SiO_2 glass ceramic to TC4 alloy side. Based on the mechanical property tests, the joints brazed at 880℃ for 5 min has the maximum shear strength of 23 MPa.