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x射线定向仪的常规用途,一般仅限于它的偏差和夹角不大于15—20°范围测定。安徽光机所试制的“x射线定向仪应用新技术”方法,较好地解决上述问题,其主要内容: 1.晶面指数及取向的快速测定:测定(hkl)面族中多级衍射的等偏角及(θKα—θKβ)的角差,直接对任何形状晶体的晶面指数或取向进行快速测定,对各种方法生长的棒状晶体特别有效。它速度快,顺利情况下只需几十分钟或十几分钟(经典劳厄定向一般要一天甚至上月),而且精度可提高1～2个数量级。 2.晶胞参数的快速测定:在不破坏样品条件下,可测成品棒晶格常数及各部分变化参
The general purpose of the x-ray direct-finder is generally limited to its deviation and determination of an included angle of not more than 15-20 °. Anhui light machine trial of “x-ray directional instrument application of new technologies,” a better solution to the above problems, its main contents: 1. Rapid determination of crystal face index and orientation: determination of (hkl) surface multi-level diffraction The declination and the angular difference between (θKα-θKβ), the rapid determination of the crystal face index or orientation of any shape of the crystal, is particularly effective for rod-shaped crystals grown by various methods. It is fast, smooth, just a few dozen minutes or ten minutes (classic Laue orientation generally one day or even last month), and the accuracy can be increased by 1 to 2 orders of magnitude. 2. The rapid determination of unit cell parameters: under the condition of not destroying the sample, the product can be measured rod lattice constant and the various parameters