Field-ion microscopy (FIM), a tool for surface analysis with atomic resolution, has been employed to observethe end structure of single-walled carbon nanotubes (SWCNTs). FIM images revealed the existence of open SWCNTends. Amorphous carbon atoms were also observed to occur around SWCNTs and traditional field evaporation failedto remove them. Heat treatment was found to be efficacious in altering the end structures of SWCNT bundles. Carbonand oxygen atoms released from heated tungsten filament are believed to be responsible for the decoration imposed onthe SWCNT ends.