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分析了导致晶体单程损耗的原因 ,设计了测量晶体单程损耗的装置。初步分析了实验结果 ,并对测试装置提出了改进方案。
The reason of the one-way loss of the crystal was analyzed, and the device of measuring the one-way loss of the crystal was designed. Preliminary analysis of the experimental results, and the testing device proposed improvements.