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一、前言随着微电子技术的飞速发展，集成电路的规模越来越大，设计周期越来越短，对测试的要求也越来越高，用传统的测试编程方法已难适应集成电路高速发展的需求。因此，在电子设计自动化（EDA）技术日趋完善的今天，通过在电路设计的同时进行故障模拟和可测性分析，借助CAD?
I. INTRODUCTION With the rapid development of microelectronic technology, the scale of integrated circuits is becoming larger and larger, the design cycles are getting shorter and shorter, and the requirements for testing are getting higher and higher. It is hard to adapt the traditional test programming methods to the high speed of integrated circuits Development needs. Therefore, in today’s increasingly perfect electronic design automation (EDA) technology, through the circuit design at the same time fault simulation and testability analysis, with CAD?