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八十年代发展的新型飞行时间二次离子质谱仪(TOF-SIMS)具有灵敏度高、质量分析范围大、质量分辨率高、几乎无表面损伤、可获得亚微米空间分辨率等特点,特别适合于有机大分子及聚合物分析.在表面粗糙化的银基体上淀积有机大分子的单分子或亚单分子层膜,在keV能量的一次离于轰击下产生的二次离子中,有很强的、由Ag~+离子加上一个完整分子的准分子离子发射.许多作者用该方法对多种聚合物进行了卓有成效的研究.最近,国外有作者为研究环氧树脂成份对金属/环氧树脂界面作用的影响,用上述方法对一系列环氧树脂成份进行了研究.我们也用同样的方法对国产环氧618及815进行了研究.
The new TOF-SIMS developed in the 1980s has the characteristics of high sensitivity, large mass analysis range, high mass resolution, almost no surface damage and sub-micron spatial resolution, and is particularly suitable for Organic Macromolecules and Polymers Analysis. Monolayers or submonolayers of organic macromolecules deposited on a surface-roughened silver matrix have strong secondary ion generation from a primary bombardment of keV energy , By the Ag ~ + ions plus a complete molecule of quasi-molecular ion emission.Many authors used this method for a variety of polymers have been fruitful research.Recently, foreign authors to study the impact of epoxy resin on the metal / epoxy Resin interface effect, using the above method of a series of epoxy resin components were studied.We also use the same method of domestic epoxy 618 and 815 were studied.