【摘 要】
:
To deal with the invalidation of commonly employed series model and parallel model in capacitance-voltage (C-V) characterization of organic thin films when curr
【机 构】
:
State Key Laboratory of Surface Physics,Fudan University,Shanghai 200433,China;State Key Laboratory
论文部分内容阅读
To deal with the invalidation of commonly employed series model and parallel model in capacitance-voltage (C-V) characterization of organic thin films when current injection is significant,a three-element equivalent circuit model is proposed.On this basis,the expression of real capacitance in consideration of current injection is theoretically derived by small-signal analysis method.The validity of the proposed equivalent circuit and theoretical expression are verified by a simulating circuit consisting of a capacitor,a diode,and a resistor.Moreover,the accurate C-V characteristic of an organic thin film device is obtained via theoretical correction of the experimental measuring result,and the real capacitance is 35.7% higher than the directly measured capacitance at 5-V bias in the parallel mode.This work strongly demonstrates the necessity to consider current injection in C-V measurement and provides a strategy for accurate C-V characterization experimentally.
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