论文部分内容阅读
目的：观察膜环境高温对下丘脑神经元延迟整流性Ｋ＋通道（Ｉｋ）电压依赖性的影响。方法：采用细胞贴附式的膜片钳技术。结果：高温可影响通道的电压依赖性，使电压依赖曲线发生正向移位，过高温度则使电压依赖性减弱甚或丧失。结论：Ｉｋ电压依赖性的变化可能参与机体的发热和中暑发病过程。
OBJECTIVE: To observe the effects of membrane hyperthermia on the voltage dependence of delayed rectifier K + channel (Ik) in hypothalamic neurons. Methods: Cell attachment patch clamp technique. Results: High temperature can affect the voltage dependence of the channel, causing the voltage-dependent curve to shift in the positive direction, whereas the excessively high temperature causes the voltage dependence to be weakened or even lost. Conclusion: The voltage-dependent changes of Ik may be involved in the pathogenesis of heat stroke and heat stroke.