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介绍了抗辐射加固设计使用的总剂量辐照效应模型,研究了它在时间延迟积分电荷耦合器件(TDI-CCD)电荷转移效率参数衰减中的应用,并通过不同剂量60Coγ辐照试验,验证了该模型在TDI-CCD器件抗辐射加固设计中的应用价值。
The total dose radiation effect model used in anti-radiation reinforcement design is introduced. Its application in the decay of charge transfer efficiency parameters of time-delay integrated charge-coupled device (TDI-CCD) is studied. The results of different 60Co γ-irradiation experiments demonstrate that The Application of TDI-CCD Device in Radiation Reinforcement Design.