We report an effective method to improve the formation of nickel stanogermanide (NiGeSn) by the incorporation of a platinum (Pt) interlayer.After the Ni/Pt/GeSn samples are annealed we obtain uniform NiGeSn thin films,which are characterized by means of sheet resistance,atomic force microscopy,scanning electron microscopy,cross-section transmission electron microscopy,and energy dispersive x-ray spectroscopy.These results show that the presence of Pt increases the smoothness and uniform morphology of NiGeSn films.