论文部分内容阅读
近年来,X光衍射线形分析方法有了新的进展,Wilkens及王煜明等分别提出了新的理论处理方法,并发表了实验结果。实践证明X光衍射线形分析方法是定量地分析晶体内部的各种面缺陷的有效方法。本文提供一种线形分析计算的简单程序,使用Basic语言在Cromemco计算机上只花费十几分钟时间就可以完成使用小计算器几天的工作量。本程序所用的公式的来源,请按论文后的索引查找,这里只按其在程序中出现的先后顺序写出来。
In recent years, X-ray diffraction linear analysis method has made new progress, Wilkens and Wang Yuming, respectively, put forward a new theoretical approach, and published the experimental results. Practice has proved that X-ray diffraction linear analysis method is quantitative analysis of various internal surface defects of the effective method. This article provides a straightforward program for linear analysis and calculation that uses the Basic language to work on a Cromemco computer for just a few minutes using a small calculator for a few days. The source of the formula used in this program, according to the index after the paper search, here only according to the order of the procedures appear written.