【摘 要】
：
美军标 MIL－ STD－ 883(以下简称 883，原名微电子器件试验方法和程序 )自 1968年问世以来，对微电子器件可靠性的提高起着重要的作用。 众所周知，微电子器件广泛应用于各类电子系统，
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美军标 MIL－ STD－ 883(以下简称 883，原名微电子器件试验方法和程序 )自 1968年问世以来，对微电子器件可靠性的提高起着重要的作用。 众所周知，微电子器件广泛应用于各类电子系统，对其可靠性要求最高。为适应微电子器件这种特殊“地位”，美国每年都要广泛收集各方面的意
The US military standard MIL-STD-883 (hereinafter referred to as 883, formerly known as microelectronic devices test methods and procedures) since its introduction in 1968, plays an important role in improving the reliability of microelectronic devices. As we all know, microelectronic devices are widely used in various electronic systems, the highest reliability requirements. In order to meet the special “status” of microelectronic devices, the United States
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