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对准聚焦常规法应力测定中衍射几何不对称引入的系统误差作了进一步分析和实验验证,侧重于衍射角高低的影响。±ψ角度下的衍射几何相差较大,相应于无应力试样ψ等于零的衍射角,±ψ角度下高角衍射峰2θ偏离量很小,可以采用单一ψ转动或±ψ转动的方法测量应力。中低角衍射峰28的偏离量较大,应用无应力标样预先消除系统误差,将修正的2θ在±ψ角度下取平均进行2θ-Sin~2ψ线性拟合。
The systematic error introduced by the asymmetry of diffraction geometry in the stress measurement of conventional focusing method was further analyzed and verified experimentally, focusing on the influence of the diffraction angle. The diffraction geometries at ± ψ are quite different, corresponding to the diffraction angle ψ of zero stress specimen. The deviation of the 2θ angle of the diffraction peak at ± ψ angle is very small. The stress can be measured by single ψ rotation or ± ψ rotation. The dispersion of the mid-low-angle diffraction peak 28 is large, and the system error is eliminated by using the unstressed standard sample. The 2θ-Sin ~ 2ψ linear fitting is performed by averaging the corrected 2θ angles at ± ψ angles.