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A revew of in situ transmission electron microscopy study on the switching mechanism and packaging r
[期刊论文] 作者：XinYang,ChenLuo,XiyueTian,FangLiang,YinXia,XinqianChen,ChaolunWang,SteveXinLiang,XingWu,JunhaoChu,
来源：JournalofSemiconductors 年份：2021
Non-volatile memory (NVM) devices with non-volatility and low power consumption properties are important in the data storage field. The switching mechanism and packaging reliability issues in NVMs are of great research interest. The switchi......
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