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[期刊论文] 作者：Chengfu Ma,Yuhang Chen,Wenhao Huang,
来源：纳米技术与精密工程(英文) 年份：2021
Atomic force microscopy(AFM)is increasingly being used as a fundamental tool for dimensional measurements at the nanoscale in the laboratory and in industry.Sin...
A dual-use probe for nano-metric photoelectric characterization using a confined light field generat
[期刊论文] 作者：Yaoping Hou,Chengfu Ma,Wenting Wang,Yuhang Chen,
来源：纳米研究（英文版） 年份：2021
We propose a plasmonic atomic force microscopy (AFM) probe,which takes a part of the laser beam for monitoring cantilever deflection as the excitation light source.Photonic crystal cavities are integrated near the cantilever\'s free end whe......
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