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IDENTIFICATION AND QUANTITATIVE TRAIT LOCI (QTL) MAPPING OF RESISTANCE GENES TO STRIPE RUST IN WUHAN
[会议论文] 作者：Xin-Li ZHOU,De-Jun HAN,Zhen-Sheng KANG,Hong-Liang GOU,
来源：The 13th International Cereal Rusts and Powdery Mildews Conf 年份：2012
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IDENTIFICATION AND QUANTITATIVE TRAIT LOCI (QTL) MAPPING OF RESISTANCE GENES TO STRIPE RUST IN WUHAN
[会议论文] 作者：Xin-Li ZHOU,De-Jun HAN,Zhen-Sheng KANG,Hong-Liang GOU,
来源：The 13th International Cereal Rusts and Powdery Mildews Conf 年份：2012
A F2 mapping population of 191 plants developed from a cross between Mingxian 169 and Wuhan 2.The parents and the F2 population was evaluated for its response to current Chinese race CYR32 in the gree...
[期刊论文] 作者：Jian-Quan Jia,Jia-Li Jiang,Kun Liang,Ru Yang,De-Jun Han,
来源：核技术（英文版） 年份：2019
The silicon photomultiplier (SiPM) with epi-taxial quenching resistor (EQR) is an emerging and developing technology that has recently attracted the interest fr...
[会议论文] 作者：Qi-Lin WANG,Qing-Dong ZENG,Xiao-Jie WANG,Zhen-Sheng KANG,Li-Li HUANG,De-Jun HAN,
来源：The 13th International Cereal Rusts and Powdery Mildews Conf 年份：2012
...
[会议论文] 作者：Qi-Lin WANG,Qing-Dong ZENG,De-Jun HAN,Xiao-Jie WANG,Zhen-Sheng KANG,Li-Li HUANG,
来源：The 13th International Cereal Rusts and Powdery Mildews Conf 年份：2012
Stripe rust,caused by Puccinia striifomis f.sp.tritici (Pst),is one of the most destructive diseases of wheat in China,generally causing 5％-10％ yield losses....
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