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[期刊论文] 作者：Sonal Jain,Deepika Gupta,Vaibhav Neema,Santosh Vishwakarma,,
来源：Journal of Semiconductors 年份：2016
We investigate the effect of a high-k dielectric in the tunnel layer to improve the erase speed-retention trade-off. Here, the proposed stack in the tunnel laye...
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