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[期刊论文] 作者:Jinchao Liu,Di Zhang,Dianqiang Yu,Mengxin Ren,Jingjun Xu, 来源:光:科学与应用(英文版) 年份:2021
Ellipsometry is a powerful method for determining both the optical constants and thickness of thin films. For decades, solutions to ill-posed inverse ellipsomet...
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