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Structural Analysis of Ultra—thin Metallic Multilayers by X—ray Anomalous Scattering Techniques at D
[期刊论文] 作者：G.M.Luo,J.Wang,等,
来源：北京同步辐射装置：英文版 年份：2001
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MICROSTRUCTURAL CHARACTERIZATION OF SPIN—VALVE MULTILAYERS BY X—RAY ANOMALYOUS DIFFRACTION TECHNIQUE
[期刊论文] 作者：M.XU,G.M.LUO,T.YANG,C.C.CHAI,Z,
来源：北京同步辐射装置：英文版 年份：2001
It is impossible to directly analyze the microstructure of spin-valve multilayers based on Ni,F,Cu and Mn by a conventional X-ray diffraction technique because...
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