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[会议论文] 作者:Dihu Chen,Dongzi Liu,Xingdong Ding,Kairou Zheng,Liangbing Zhao,Yueli Zhang,Guocong Lin,
来源:The 6th International Conference on Nanoscience and Technolo 年份:2015
The lateral resolution in Atomic force microscopy(AFM)is mainly determined by the size of the tip which contributes most significantly to the total interact...
[会议论文] 作者:Xingdong Ding,Kairou Zheng,Liangbing Zhao,Dongzi Liu,Guocong Lin,Yueli Zhang,Dihu Chen,
来源:The 6th International Conference on Nanoscience and Technolo 年份:2015
The lateral resolution in Atomic force microscopy(AFM)is mainly determined by the size of the tip which contributes most significantly to the total interaction between tip and sample....
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