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[会议论文] 作者:H.Plank,R.Winkler,R.Schmied,A.Orthacker,J.Kraxner,B.Chernev,C.Mayrhofer,J.E.Fr(o)ch,J.Hobisch,G.Trimmel, 来源:The 6th International Conference on Nanoscience and Technolo 年份:2015
During the last decade focused ion beam(FIB)processing has become an essential tool for sub-surface(3D)metrology and the site specific fabrication of ultrathin lamellas suitable for transmission elect...
[会议论文] 作者:H.Plank[1]R.Winkler[2]R.Schmied[2]A.Orthacker[2]J.Kraxner[2]B.Chernev[2]C.Mayrhofer[2]J.E.Fr(o)ch[2]J.Hobisch, 来源:The 6th International Conference on Nanoscience and Technolo 年份:2015
  During the last decade focused ion beam(FIB)processing has become an essential tool for sub-surface(3D)metrology and the site specific fabrication of ultrat...
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