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[期刊论文] 作者：Ai-Bin Yan,Hua-Guo Liang,Zheng,
来源：电子科技学刊：英文版 年份：2016
Technology scaling results in the propagation-induced pulse broadening and quenching(PIPBQ) effect become more noticeable.In order to effectively evaluate the s...
[期刊论文] 作者：Tian-Song Yu,Hua-Guo Liang,Da-,
来源：电子科技学刊：英文版 年份：2015
The shrinking silicon feature size causes the continuous increment of the aging effect due to the negative bias temperature instability(NBTI), which becomes a p...
[期刊论文] 作者：Tian-Song Yu,Hua-Guo Liang,Da-Wen Xu,Lu-Sheng Wang,,
来源：Journal of Electronic Science and Technology 年份：2015
The shrinking silicon feature size causes the continuous increment of the aging effect due to the negative bias temperature instability(NBTI), which becomes a p...
[期刊论文] 作者：Ai-Bin Yan,Hua-Guo Liang,Zheng-Feng Huang,Zhi Wang,Cui-Yun Jiang,,
来源：Journal of Electronic Science and Technology 年份：2016
Technology scaling results in the propagation-induced pulse broadening and quenching(PIPBQ) effect become more noticeable.In order to effectively evaluate the s...
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