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,Research on SEE mitigation techniques using back junction and p+buffer layer in domestic non-DTI Si
[期刊论文] 作者：Jia-Nan Wei,Chao-Hui He,Pei Li,Yong-Hong Li,
来源：中国物理B（英文版） 年份：2019
In this paper we investigate two techniques for single event effect (SEE) mitigation by using back junction and p+buffer layer in non-deep trench isolation (DTI...
,Impact of proton-induced alteration of carrier lifetime on single-event transient in SiGe heterojun
[期刊论文] 作者：Jia-Nan Wei,Chao-Hui He,Pei Li,Yong-Hong Li,Hong-Xia Guo,
来源：中国物理B（英文版） 年份：2019
This paper presents an investigation into the impact of proton-induced alteration of carrier lifetime on the single-event transient (SET) caused by heavy ions i...
[期刊论文] 作者：Xiao-Yu Pan,Hong-Xia Guo,Yin-Hong Luo,Feng-Qi Zhang,Li-Li Ding,Jia-Nan Wei,Wen Zhao,
来源：中国物理B（英文版） 年份：2017
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[期刊论文] 作者：WU Lei,LI Chang-bin,XIE Xu-hong,LV Jia-nan,WEI Jian-mei,ZHOU Xuan,YANG Lin-shan,
来源：山地科学学报（英文版） 年份：2021
To better understand the variation in mountainous discharge (MD) in the future,a basin case study was conducted in the upstream Taolai River Basin (UTRB) in arid northwestern China.The Blaney-Criddle (B-C) equation,Budyko framework,and wate......
[期刊论文] 作者：Jia-Nan Wei,Hong-Xia Guo,Feng-Qi Zhang,Yin-Hong Luo,Li-Li Ding,Xiao-Yu Pan,Yang Zhang,Yu-Hui Liu,
来源：中国物理B（英文版） 年份：2017
The impact of ionizing radiation effect on single event upset (SEU) sensitivity of ferroelectric random access memory (FRAM) is studied in this work.The test sp...
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