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[期刊论文] 作者：Jiang Shouzhen Li Xianxiang,
来源：中国稀土学报：英文版 年份：2006
High-resolution X-ray diffractometry (HRXRD) was used to assess the quality of 6H-SiC crystals grown by sublimation method. The results show the occurrence of l...
[期刊论文] 作者：Jiang Shouzhen,Li Xianxiang,Do,
来源：稀土学报（英文版） 年份：2004
High-resolution X-ray diffractometry (HRXRD) was used to assess the quality of 6H-SiC crystals grown by sublimation method. The results show the occurrence of l...
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