搜索筛选:
搜索耗时4.4171秒,为你在为你在102,285,761篇论文里面共找到 2 篇相符的论文内容
发布年度:
Heavy ion-induced single event upset sensitivity evaluation of 3D integrated static random access me
[期刊论文] 作者:Xue-Bing Cao,Li-Yi Xiao,Ming-X,
来源:核技术:英文版 年份:2018
Heavy ion-induced single event upsets (SEUs) of static random access memory (SRAM), integrated with three-dimensional integrated circuit technology, are evaluat...
,Heavy ion-induced single event upset sensitivity evaluation of 3D integrated static random access m
[期刊论文] 作者:Xue-Bing Cao,Li-Yi Xiao,Ming-Xue Huo,Tian-Qi Wang,Shan-Shan Liu,Chun-Hua Qi,An-Long Li,Jin-Xiang Wang,
来源:核技术(英文版) 年份:2018
Heavy ion-induced single event upsets (SEUs) of static random access memory(SRAM),integrated with three-dimensional integrated circuit technology, are eval-uate...
相关搜索: