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Numerical study of the lateral resolution in electrostatic force microscopy for high resolution imag
[会议论文] 作者：Liangbin Zhao,Xidong Ding,
来源：International Conference on Nanoscience & Technology,China 2 年份：2013
Electrostatic force microscopy (EFM) including its derivative, Kelvin probe force microscopy, is widely used to investigate mesoscepic/nanoscopic conducting/ semiconducting structures and electrical i...
Bimodal Magnetic Force Microscopy for Superparamagnetic Nanopaticles with an external modulation mag
[会议论文] 作者：Xidong Ding,Liangbin Zhao,Dongzi Liu,
来源：International Conference on Nanoscience & Technology,China 2 年份：2013
Superparamagnetic nanoparticles (SPNs) have become increasingly important in applications ranging from solid state memory devices to biomedical diagnostic and therapeutic tools.However, detection and...
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