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SIMS Depth Profiling and 3D characterization of Organic/Inorganic Surfaces by FIB Crater Wall Imagin
[会议论文] 作者：S.Kayser,F.Kollmer,R.M(o)llers,D.Rading,H.Arlinghaus,E.Niehuis,
来源：第五届中国二次离子质谱学会议 年份：2014
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SIMS Depth Profiling and 3D characterization of OrganicInorganic Surfaces by FIB Crater Wall Imaging
[会议论文] 作者：S.Kayser,F.Kollmer,R.M(o)llers,D.Rading,H.Arlinghaus,E.Niehuis,
来源：第五届中国二次离子质谱学会议 年份：2014
Information on the chemical composition,physical properties and thethree-dimensional structure of materials and devices is of major importance.TOF-SIMS is known...
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