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[期刊论文] 作者：Pengfei Wang,Ruihua Nan,Zengyun Jian,,
来源：Journal of Semiconductors 年份：2017
The deep-level defects of Cd Zn Te(CZT)crystals grown by the modified vertical Bridgman(MVB)method act as trapping centers or recombination centers in the band...
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