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Analysis of recoverable and permanent components of threshold voltage shift in NBT stressed p-channe
[期刊论文] 作者：Danijel Dankovi,Ninoslav Stojadinovi,Zoran Priji,Ivica Mani,Vojkan Davidovi,Aneta Priji,Snezana Djoric-Veljkovi,
来源：Chinese Physics B 年份：2015
In this study we investigate the dynamic recovery effects in IRF9520 commercial p-channel power vertical double diffused metal–oxide semiconductor field-effect...
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