搜索筛选:
搜索耗时5.6929秒,为你在为你在102,285,761篇论文里面共找到 5 篇相符的论文内容
发布年度:
[期刊论文] 作者：W.D. van Driel,P.J.J.H.A. Habe,
来源：电子与封装 年份：2007
Since Moisture Sensitivity Level (MSL) tests are part of the international reliability qualification standards, all the microelectronics components/products hav...
[期刊论文] 作者：Zaal,W.D. van Driel,H.P,
来源：电子工业专用设备 年份：2008
在大多数移动通信装置的寿命中最常见的故障是通过跌落撞击产生的、这是当今通过跌落撞击测试的方法测得的，该方法已经通过了JEDEC标准？然而这种方法相当耗时，且复验性方面还存......
[期刊论文] 作者：W.D. van Driel,P.J.J.H.A. Habets,M.A.J. van Gils,,
来源：电子与封装 年份：2007
Since Moisture Sensitivity Level (MSL) tests are part of the international reliability qualification standards, all the microelectronics components/products hav...
[会议论文] 作者：Wei,W.D. van Driel,G.Q. Zhang,
来源：第十届中国国际半导体照明论坛 年份：2013
Although color shift is one of the key issues to be considered for the failure of LEDs products,there is limited literature that correlated LED products’ lifetime performance to their color shift over...
[会议论文] 作者：Guangjun Lu,W.D. van Driel,Xuejun Fan,M. Yazdan Mehr,Jiajie Fan,Cheng Qian,G.Q. Zhang,
来源：第十二届中国国际半导体照明论坛 年份：2015
Color shift mechanism of LED lighting is complex due to its much more comprehensive structure,generally composed of LED die,phosphor,silicone,reflector,diffusers,and so on,each of them may contribute...
相关搜索：
