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[期刊论文] 作者：Xiao-hua LUO,Zheng-wen ZHANG,
来源：中国整形与重建外科（英文） 年份：2019
The cleft lip nasal deformity accounts for 84％ of nasal deformities,which is one of the most common diseases in plastic surgery.The Unilateral cleft lip nasal de...
[期刊论文] 作者：Yong DING,Xiao-hua LUO,Xiao-lang YAN,
来源：浙江大学学报（英文版）（C辑：计算机与电子） 年份：2011
Low-frequency noises (LFN) and noise-like oscillations (NLO) in GaAs metal semiconductor field effect transistor (MESFET) channel current were investigated unde...
[期刊论文] 作者：Xiao-Hua Luo,Wei-Jun Ren,Wei Jin,Zhi-Dong Zhang,
来源：中国物理B（英文版） 年份：2017
Solid refrigeration technology based on the elastocaloric effect has a great potential altative to the conventional vapor compression cooling.Here we report the...
[期刊论文] 作者：Xiao-hua LUO,Li-sheng CHEN,Jiao-jiao ZHU,Xiao-lang YAN,
来源：浙江大学学报（英文版）（C辑：计算机与电子） 年份：2012
For accurate prediction of via yield,via chains are usually fabricated on test chips to investigate issues about vias.To minimize the randomness of experiments...
[期刊论文] 作者：Li-sheng CHEN,Xiao-hua LUO,Jiao-jiao ZHU,Fan-chao JIE,Xiao-lang YAN,,
来源：Journal of Zhejiang University-Science C(Computers & Electro 年份：2013
Due to the importance of metal layers in the product yield,serpentine test structures are usually fabricated on test chips to extract parameters for yield predi...
,Scratch-concerned yield modeling for IC manufacturing involved with a chemical mechanical polishing
[期刊论文] 作者：Jiao-jiao ZHU,Xiao-hua LUO,Li-sheng CHEN,Yi YE,Xiao-lang YAN,
来源：浙江大学学报（英文版）（C辑：计算机与电子） 年份：2012
In existing integrated circuit (IC) fabrication methods,the yield is typically limited by defects generated in the manufacturing process.In fact,the yield often...
[会议论文] 作者：Wei Chen,Xiao-Hua Luo,Ying-Ying Zhang,Zhuo Wang,Hong-Bing Wang,
来源：中国化学会第十届全国天然有机化学学术会议 年份：2014
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