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[会议论文] 作者：XingZhou[1]DanDan[1]MingLei[1]JiaQian[1]BaoliYao[1]TongYe[2]DiWu[1]YanlongYang[1]RunzeLi[1]TongPeng[1,
来源：The 4th Advances in Optoelectronics and Micro/nano-optics (A 年份：2014
Structured illumination microscopy (SIM) has the axially sectioning capability due to the rejection of out-of-focus portion of image by patterned illumina-t...
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