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[会议论文] 作者：Xue-Lu Liu,Jiang-Bin Wu,Ping-Heng Tan,
来源：第十八届全国光散射学术会议 年份：2015
Raman spectroscopy has proven to be a standard contactless, non-destructive and highly specific method for semiconductor material characterization like a chemic...
[会议论文] 作者：Xue-Lu Liu,Jiang-Bin Wu,Ping-Heng Tan,
来源：第十八届全国光散射学术会议 年份：2015
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[期刊论文] 作者：Xue-Lu Liu,Yu-Chen Leng,Miao-Ling Lin,Xin Cong,Ping-Heng Tan,
来源：中国物理B（英文版） 年份：2021
Raman spectroscopy has been widely used to characterize the physical properties of two-dimensional materials(2DMs).The signal-to-noise ratio (SNR or S/N ratio) of Raman signal usually serves as an important indicator to evaluate the instrum......
[期刊论文] 作者：Qing-Hai Tan,Yu-Jia Sun,Xue-Lu Liu,Kai-Xuan Xu,Yuan-Fei Gao,Shu-Liang Ren,Ping-Heng Tan,Jun Zhang,
来源：纳米研究（英文版） 年份：2021
The polarization selection rule of Raman scattering is crucial in symmetry analysis of elementary excitations in semiconductors and correlated electron systems....
[期刊论文] 作者：Miao-Ling Lin,Yu-Chen Leng,Xin Cong,Da Meng,Jiahong Wang,Xiao-Li Li,Binlu Yu,Xue-Lu Liu,Xue-Feng Yu,Ping-Heng,
来源：科学通报（英文版） 年份：2020
The selection rule for angle-resolved polarized Raman (ARPR) intensity of phonons from standard group-theoretical method in isotropic materials would break down...
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