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[期刊论文] 作者：Yanqing Wang,Hao Zheng,Weiwei,
来源：国际计算机前沿大会会议论文集 年份：2017
To solve the recognition of road sign with an intelligent vehicle in vision-based navigation,road sign extraction and matching techniques required in outdoor sc...
[期刊论文] 作者：Xianhong Zheng,Weiwei Wang,Rui,
来源：中国神经再生研究：英文版 年份：2012
Tau hyperphosphorylation is a main cause of neuronal loss in Alzheimer's disease,which can be caused by many factors,including oxidative stress.The multifun...
Exploring the Inhibitory Mechanism of Approved Selective Norepinephrine Reuptake Inhibitors from Mol
[会议论文] 作者：Guoxun Zheng,Weiwei Xue,Zhu Feng,
来源：第四届国际分子模拟大会(The International Conference on Molecular Simula 年份：2016
...
Orientation dependency of shear stress-strain curves in B2-ordered Fe3Al single crystals deformed in
[期刊论文] 作者：ZHENG Weiwei(郑为为) YANG Wangyue,
来源：中国科学：技术科学英文版 年份：2002
B2-ordered Fe3Al single crystals with various orientations were deformed in tension at room temperature in vacuum. The shape of shear stress-strain curves and w...
[期刊论文] 作者：ZHENG Weiwei,CHEN Feng,XU Yuehua,ZHANG Jing,ZHAI Heng,
来源：中国高等学校学术文摘·农学 年份：2007
A two-year trial was conducted to test the interactive effects of special-for-apple organic fertilizer,CaSO4,and amino acid Ca on Fuji/Balenghaitang (Malus robu...
Endoplasmic Reticulum Stress Induced by Tunicamycin and Thapsigargin Protectsagainst Transient Ische
[会议论文] 作者：Xiangnan Zhang,Yang Yuan,Lei Jiang,Yanrong Zheng,Weiwei Hu,Zhong Chen,
来源：第十四届全国生化与分子药理学学术会议 年份：2015
...
Endoplasmic Reticulum Stress Induced by Tunicamycin and Thapsigargin Protectsagainst Transient Ische
[会议论文] 作者：Xiangnan Zhang,Yang Yuan,Lei Jiang,Yanrong Zheng,Weiwei Hu,Zhong Chen,
来源：第十四届全国生化与分子药理学学术会议 年份：2004
...
Endoplasmic Reticulum Stress Induced by Tunicamycin and Thapsigargin Protectsagainst Transient Ische
[会议论文] 作者：Xiangnan Zhang,Yang Yuan,Lei Jiang,Yanrong Zheng,Weiwei Hu,Zhong Chen,
来源：第十四届全国生化与分子药理学学术会议 年份：2015
Transient cerebral ischemia leads to the endoplasmic reticulum (ER) stress.However,thecontributions of ER stress to cerebral ischemia are not clear.To address this issue,the ER stress activators tunic...
Determination of failure degree of 1.2 kV SiC MOSFETs after short-circuit test using an improved tes
[期刊论文] 作者：ner,Zedong Zheng,Weiwei He,
来源：纳米技术与精密工程（英文） 年份：2020
Analysis of the short-circuit characteristics of SiC metal-oxide-semiconductorfield-effect transistors (MOSFETs) is very important for their practical applicati...
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