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[期刊论文] 作者:Zhang Jin-Feng,Zhang Jin-Cheng,Hao Yue, 来源:中国物理(英文版) 年份:2004
The theoretic calculation and analysis of the temperature dependence of Hall electron density of a sample AlGaN/GaN heterostructure has been carried out in the...
[期刊论文] 作者:Zhang Jin-Feng,Wang Chong,Zhang Jin-Cheng,Hao Yue, 来源:中国物理(英文版) 年份:2006
It was reported by Shen et al that the two-dimensional electron gas (2DEG) in an AlGaN/AlN/GaN structure showed high density and improved mobility compared with...
[期刊论文] 作者:Zhang Jin-Feng,Mao Wei,Zhang Jin-Cheng,Hao Yue, 来源:中国物理B(英文版) 年份:2008
To reveal the inteal physics of the low-temperature mobility of two-dimensional electron gas (2DEG) in AlGaN/GaN heterostructures, we present a theoretical stud...
[期刊论文] 作者:Zhang Jin-Feng,Xu Sheng-Rui,Zhang Jin-Cheng,Hao Yue, 来源:中国物理B(英文版) 年份:2011
[期刊论文] 作者:Xue Jun-Shuai,Hao Yue,Zhang Jin-Cheng,Ni Jin-Yu, 来源:中国物理B(英文版) 年份:2010
[期刊论文] 作者:Gao Zhi-Yuan,Hao Yue,Zhang Jin-Cheng,Li Pei-Xian,Gu Wen-Ping, 来源:中国物理B(英文版) 年份:2009
[期刊论文] 作者:Li Zhi-Ming,Hao Yue,Zhang Jin-Cheng,Xu Sheng-Rui,Ni JinYu, 来源:中国物理B(英文版) 年份:2009
[期刊论文] 作者:Zhang Jin-Cheng,Zheng Peng-Tian,Zhang Juan,Xu Zhi-Hao,Hao Yue, 来源:中国物理B(英文版) 年份:2009
This paper finds that the two-dimensional electron gas density in high Al-content AlGaN/GaN heterostructures exhibits an obvious time-dependent degradation afte...
[期刊论文] 作者:Li Liang,Yang Lin-An,Zhou Xiao-Wei,Zhang Jin-Cheng,Hao Yue, 来源:中国物理B(英文版) 年份:2013
[期刊论文] 作者:JIANG Teng,XU Sheng-Rui,ZHANG Jin-Cheng,LIN Zhi-Yu,JIANG Ren-Yuan,HAO Yue, 来源:中国物理快报(英文版) 年份:2015
[期刊论文] 作者:Yue Yuan-Zheng,Hao Yue,Zhang Jin-Cheng,Feng Qian,Ni Jin-Yu,Ma Xiao-Hua, 来源:中国物理B(英文版) 年份:2008
This paper studies systematically the drain current collapse in AlGaN/GaN metal-oxide-semiconductor high electron mobility transistors (MOS-HEMTs) by applying p...
[期刊论文] 作者:Xu Zhi-Hao,Zhang Jin-Cheng,Zhang Zhong-Fen,Zhu Qing-Wei,Duan Huan-Tao,Hao Yue, 来源:中国物理B(英文版) 年份:2009
[期刊论文] 作者:Fan Long,Hao Yue,Zhao Yuan-Fu,Zhang Jin-Cheng,Gao Zhi-Yuan,Li Pei-xian, 来源:中国物理B(英文版) 年份:2009
Using depletion approximation theory and introducing acceptor defects which can characterize radiation induced deep-level defects in AlGaN/GaN heterostructures,...
[期刊论文] 作者:Zhao Yi,Zhang Jin-Cheng,Xue Jun-Shuai,Zhou Xiao-Wei,Xu Sheng-Rui,Hao Yue, 来源:中国物理B(英文版) 年份:2015
[期刊论文] 作者:Cao Meng-Yi,Zhang Kai,Chen Yong-He,Zhang Jin-Cheng,Ma Xiao-Hua,Hao Yue, 来源:中国物理B(英文版) 年份:2014
[期刊论文] 作者:Feng Qian,Li Qian,Xing Tao,Wang Qiang,Zhang Jin-Cheng,Hao Yue, 来源:中国物理B(英文版) 年份:2012
[期刊论文] 作者:Chen Wei-Wei,Ma Xiao-Hua,Hou Bin,Zhu Jie-Jie,Zhang Jin-Cheng,Hao Yue, 来源:中国物理B(英文版) 年份:2013
[期刊论文] 作者:Wang Chong,He Yun-Long,Zheng Xue-Feng,Ma Xiao-Hua,Zhang Jin-Cheng,Hao Yue, 来源:中国物理B(英文版) 年份:2013
[期刊论文] 作者:YUE Yuan-Zheng,HAO Yue,FENG Qian,ZHANG Jin-Cheng,MA Xiao-Hua,NI Jin-Yu, 来源:中国物理快报(英文版) 年份:2007
We report a GaN metal-oxide-semiconductor high electron mobility transistor (MOS-HEMT) with atomic layer deposited (ALD) Al2O3 gate dielectric. Based on the pre...
[期刊论文] 作者:LI Zhi-Ming,JIANG Hai-Ying,HAN Yan-Bin,LI Jin-Ping,YIN Jian-Qin,ZHANG Jin-Cheng, 来源:中国物理快报(英文版) 年份:2012
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