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[期刊论文] 作者：揭斌斌,薩支唐,,
来源：半导体学报 年份：2012
Low-frequency and High-frequency Capacitance-Voltage(C-V) curves of Silicon Metal-Oxide-Semiconductor Capacitors,showing electron and hole trapping at shallow-l...
[期刊论文] 作者：揭斌斌,薩支唐,,
来源：半导体学报 年份：2012
Metal-Oxide-Semiconductor Capacitance-Voltage(MOSCV) characteristics containing giant carrier trapping capacitances from 3-charge-state or 2-energy-level impuri...
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