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Synergistic effects of total ionizing dose on single event upset sensitivity in static random access
[期刊论文] 作者：肖尧,郭红霞,张凤祁,赵雯,王燕萍,张科营,丁李利,范雪,罗尹虹,王园明,,
来源：Chinese Physics B 年份：2014
Synergistic effects of the total ionizing dose(TID) on the single event upset(SEU) sensitivity in static random access memories(SRAMs) were studied by using pro...
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