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[期刊论文] 作者:Jianing Guo,Dongli Zhang,Mingxiang Wang,Huaisheng Wang, 来源:中国物理B(英文版) 年份:2021
A new type of degradation phenomena featured with increased subthreshold swing and threshold voltage after negative gate bias stress (NBS) is observed for amorphous InGaZnO (a-IGZO) thin-film transistors (TFTs),which can recover in a short ......
[期刊论文] 作者:Zheng Gong,Peizhen Zhang,Wenjun Zheng,Dongli Zhang,Binbin Xu, 来源:大地测量与地球动力学(英文版) 年份:2021
The elastic thickness of the lithosphere (Te) is a key parameter used to describe the strength of the lithosphere. It is usually estimated by a spectral analysi...
[期刊论文] 作者:Zheng Gong,Peizhen Zhang,Wenjun Zheng,Dongli Zhang,Binbin Xu,, 来源:Geodesy and Geodynamics 年份:2021
The elastic thickness of the lithosphere(T_e) is a key parameter used to describe the strength of the lithosphere.It is usually estimated by a spectral analysis between gravity and topography.In previ...
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