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[期刊论文] 作者：ShengzhenYi,FengZhang,QiushiHuang,LaiWei,YuqiuGu,ZhanshanWang,
来源：HighPowerLaserScienceandEngineering 年份：2021
High-resolution X-ray flash radiography of Ti characteristic lines with a multilayer Kirkpatrick–Baez microscope was developed on the Shenguang-II (SG-II) Update laser facility. The microscope uses an optimized multilayer design of Co/C an......
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