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[期刊论文] 作者：Wei-Tao Yang,Yong-Hong Li,Ya-Xin Guo,Hao-Yu Zhao,Yang Li,Pei Li,Chao-Hui He,Gang Guo,Jie Liu,Sheng-Sheng,
来源：中国物理B（英文版） 年份：2020
Single event effects (SEEs) in a 28-nm system-on-chip (SoC) were assessed using heavy ion irradiations, and suscep-tibilities in different processor configurati...
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