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,Negative gate bias stress effects on conduction and low frequency noise characteristics in p-type p
[期刊论文] 作者：Chao-Yang Han,Yuan Liu,Yu-Rong Liu,Ya-Yi Chen,Li Wang,Rong-Sheng Chen,
来源：中国物理B（英文版） 年份：2019
The instability of p-channel low-temperature polycrystalline silicon thin film transistors (poly-Si TFTs) is investigated under negative gate bias stress (NBS)...
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