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[期刊论文] 作者:Kai Xi,Di Jiang,Shan-Shan Gao,Jie Kong,Hong-Yun Zhao,Hai-Bo Yang,Tian-Qi Liu,Bin Wang,Bing Ye,Jie Liu, 来源:核技术(英文版) 年份:2017
We predict proton single event effect (SEE) error rates for the VATA160 ASIC chip on the Dark Matter Particle Explorer (DAMPE) to evaluate its radiation toleran...
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