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[会议论文] 作者：Chunzeng Li,Stephen Minne,Yan Hu,Ji Ma,Jianli He,Henry Mittel,Natalia Erina,Senti Guo,Thomas Muller,
来源：第三届纳米化学前沿论坛(Frontiers of Nanochemistry-2013) 年份：2013
Kelvin probe force microscopy (KPFM, also known as surface potential microscopy) measures the work function, or electric potential, of materials or charges on t...
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